Empowering semiconductor innovators with advanced prober controller systems and intelligent data analysis solutions-engineered to Improve Cost of Ownership and Cost of Test, enhance throughput, and ensure peak performance across both new and legacy equipment.
Comprehensive solutions for advanced semiconductor testing and data analysis
SMART Probe (SP) is a cost-effective test cell controller designed to enhance semiconductor prober performance. It streamlines automated
wafer testing, reduces downtime, and improves throughput.
SP integrates hardware and software to deliver precise sequencing control, minimizing probe misalignment and improving test accuracy across
multiple wafers.
The Tester Monitoring Daemon (TMD) is a lightweight, high-speed data snooper designed to operate directly on your test equipment—no extra hardware,
no floor space required. TMD captures STDF data streams in real time and transmits them seamlessly to your SMART Server, enabling instant visibility
into production metrics and test outcomes.
But it doesn’t stop there. TMD also monitors GPIB or Parallel/TTL communication traffic, extracting key performance data without disrupting
your test flow. Its non-intrusive architecture ensures zero impact on throughput, while its rapid data relay keeps your monitoring systems fully up to date.
Whether you're tracking yield, cycle time, or equipment health, TMD delivers the data you need - fast, clean, and in real time.
There has been a long parade of systems and buzzwords over the years, promising real time visibility into manufacturing processes. All have proven too
complex or too costly to be practical.
Monitor the entire Factory, a test floor, a particular Test Cell, or test sites.
SMART provides automated data collection and system monitoring for OEE metrics. With a glance you can immediately spot yield, throughput, or productivity problems
anywhere on your test floor during any time of the working day.
pcFIRMS is a Data Analysis tool for Semiconductor Test Data Analysis. Based on a solid relational database,
pcFIRMS provides both simple & advanced features that allows you to quickly produce Charts, Wafer Maps, DataViews & Text Reports. Output everything to a running
Word file with a single click of the mouse to quickly create a publication ready report.
While STDF version 4 is the native input for pcFIRMS, custom loaders/converters for a variety of ASCII and Binary files are available and can be easily created.
The DataPipeline Server receives data from your processes, stores them in a convenient database, and provides tools for accessing
and managing the huge amounts of data produced by the semiconductor manufacturing process.
Proven 24/7 reliability, virtually unlimited scalability, and easy administration, combine to provide a convenient way to collect, store,
access, and use the large quantities of data generated by Wafer Fabrication, Probe, Assembly, and ATE equipment in your factories in a cost effective
manner.
Integration into your processes is simple. When you start a new process, just send us the data files. We create new STDF converters and optimizers quickly. Plug
these converters right into the DataPipeline or pcFIRMS and your new process is being monitored
Pioneering advanced testing solutions with decades of expertise in semiconductor technology
To revolutionize semiconductor testing through innovative prober controller systems and comprehensive data analysis solutions that enable breakthrough research and development in the technology sector.
Our commitment to continuous innovation ensures that our clients have access to the most advanced prober control systems and data analysis capabilities available in the market today.
Our expertise in software/hardware design includes non-intrusive real time STDF data acquisition, FPGA-PCB design, Overall Equipment Efficiency (OEE), Standard Test Data Format (STDF) and similar types, data rendering, data management, mining, and statistical analysis, Measurement System Analysis (MSA), Gage Repeatability & Reproducibility (Gage R&R), Process and Product Characterization, Part Average Testing (PAT), Statistical Process Control (SPC) charts and custom alerts and reports.
Ready to discuss your prober controller and data analysis needs? Contact our expert team today.
+1 (512) 651-3008
Get a personalized quote or additional Information