Identify Bottlenecks with SMART Manufacturing

     System  Monitoring  Analysis  in  Real  Time

    SMART Monitor provides Real Time Monitoring of Wafer Sort and Final Test Equipment.  SMART Control provides Real Time Wafermapping and Control of Probers.

    Our SMART System captures EVERY PART in Real Time, (including Time of Test, Bin, XY, Test Time, Index Time, etc.) with millisecond accuracy. Two Ways to Capture Data DEVICE BY DEVICE!  Hardware, sBox, snoops ALL Tester/Equipment Interfaces device by device. Software, TMD (Tester Monitoring Daemon), snoops handler logs and Tester STDF files AS they are being written.

        SMART Server provides:
             Yields Trends
             Standby, Stop times
             UPH, MTBF, MTBA, etc.
             Test and Index times (msec)
             Hardware Bin Pareto
             Run Rate UPH
             Real Time Wafer mapping
             Retest Failing Device

SMART Features:
     GPIB/IEEE 488
     TTL 30 I/O Multi site
     Serial RS232 (2 ports)
     A/D